A review of the state of the art when measuring the nanohardness using the Atomic Force Microscope
in nanotechnology, one of the powerful tools is the atomic force microscope (AFM). Instrument used to characterize materials superficially. Nanoscale hardness (nanohardness) using nanoindentation method spectroscopy mode is considered when evaluating these characteristics. The suitable equipment to...
- Autores:
- Tipo de recurso:
- Article of journal
- Fecha de publicación:
- 2019
- Institución:
- Universidad Católica de Pereira
- Repositorio:
- Repositorio Institucional - RIBUC
- Idioma:
- spa
- OAI Identifier:
- oai:repositorio.ucp.edu.co:10785/9786
- Acceso en línea:
- https://revistas.ucp.edu.co/index.php/entrecienciaeingenieria/article/view/556
http://hdl.handle.net/10785/9786
- Palabra clave:
- Rights
- openAccess
- License
- Derechos de autor 2019 Entre Ciencia e Ingeniería