Fabrication and Characterization of Alq3 Thin Films
Alq3 (tris (8-hydroxyquinolate) aluminum) thin films were deposited on glass by thermal evaporation in order to establish the optimal evaporation rates of thin films deposited between 30 to 120nm on a substrate with temperatures between 60 and 120°C. The
- Autores:
-
Adames, R. P.
Segura, J A
Gómez, D P
Ardila, A M
- Tipo de recurso:
- Fecha de publicación:
- 2014
- Institución:
- Universidad EAFIT
- Repositorio:
- Repositorio EAFIT
- Idioma:
- spa
- OAI Identifier:
- oai:repository.eafit.edu.co:10784/14396
- Acceso en línea:
- http://hdl.handle.net/10784/14396
- Palabra clave:
- Thin Film
Thermal Evaporation
Substrate
Characterization
Organic Semiconductor
Película Delgada
Evaporación Térmica
Sustrato
Caracterización
Semiconductor Orgánico
- Rights
- License
- Copyright (c) 2014 R. P. Adames, J A Segura, D P Gómez, A M Ardila