Síntesis, caracterización estructural y eléctrica de películas de V2O5 .nH2O
V2O5 .nH2O films were characterized structurally, vibrationally, and electrically, as well as synthesized by the method of rapid cooling or quenching. The films submitted to thermal treatment among 100°C and 200°C during 24 hours showed slight variations in the crystal structure with a preferred ori...
- Autores:
-
Londoño C., César Leandro
Hernández J., Carlos Vargas
Jurado, Fabián
- Tipo de recurso:
- Fecha de publicación:
- 2009
- Institución:
- Universidad de San Buenaventura
- Repositorio:
- Repositorio USB
- Idioma:
- spa
- OAI Identifier:
- oai:bibliotecadigital.usb.edu.co:10819/5118
- Acceso en línea:
- http://hdl.handle.net/10819/5118
- Palabra clave:
- Conductancia eléctrica
Espectroscopia µ-Raman
Electrical conductance
Spectroscopy µ-Raman
V2O5 .nH2O
XRD
Espectroscopia raman
Semiconductores
- Rights
- License
- Atribución-NoComercial-SinDerivadas 2.5 Colombia
| Summary: | V2O5 .nH2O films were characterized structurally, vibrationally, and electrically, as well as synthesized by the method of rapid cooling or quenching. The films submitted to thermal treatment among 100°C and 200°C during 24 hours showed slight variations in the crystal structure with a preferred orientation along [a00]. The electrical conductance showed an Arrhenius type behavior, typical of semiconductor materials, with activation energies of 0.246( ± )0.001 eV for the sprinkle and 0.262( ± )0.002 eV for the film submitted to thermal treatment at 200°C for 24 hours. These energy values are very close to those reported for vanadium pentoxide. µ-Raman spectra at room temperature confirmed the presence of vibrational modes, typical of vanadium oxide. |
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