The Schottky diode as attenuator of the Seebeck effect on a Peltier cell for a PID temperature control
In nanotechnology, one of the powerful tools is the atomic force microscope (AFM). Instrument used to characterize materials superficially. Nanoscale hardness (nanohardness) using nanoindentation method spectroscopy mode is considered when evaluating these characteristics. The suitable equipment to...
- Autores:
- Tipo de recurso:
- Article of journal
- Fecha de publicación:
- 2019
- Institución:
- Universidad Católica de Pereira
- Repositorio:
- Repositorio Institucional - RIBUC
- Idioma:
- spa
- OAI Identifier:
- oai:repositorio.ucp.edu.co:10785/9787
- Acceso en línea:
- https://revistas.ucp.edu.co/index.php/entrecienciaeingenieria/article/view/558
http://hdl.handle.net/10785/9787
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- Rights
- openAccess
- License
- Derechos de autor 2019 Entre Ciencia e Ingeniería
| id |
RepoRIBUC2_fc2af1848b4d550901f0f15aa9bb7d48 |
|---|---|
| oai_identifier_str |
oai:repositorio.ucp.edu.co:10785/9787 |
| network_acronym_str |
RepoRIBUC2 |
| network_name_str |
Repositorio Institucional - RIBUC |
| repository_id_str |
|
| spelling |
2022-06-01T19:08:32Z2022-06-01T19:08:32Z2019-07-13https://revistas.ucp.edu.co/index.php/entrecienciaeingenieria/article/view/558http://hdl.handle.net/10785/9787In nanotechnology, one of the powerful tools is the atomic force microscope (AFM). Instrument used to characterize materials superficially. Nanoscale hardness (nanohardness) using nanoindentation method spectroscopy mode is considered when evaluating these characteristics. The suitable equipment to measure the hardness in materials such as thin films, with thicknesses on the order of tens of nanometers is the AFM. In this article, the authors propose a first approach to some models used to evaluate the hardness, using the AFM, based on the elastic model.En la nanociencia y en la nanotecnología, una de las herramientas más poderosas es el microscopio de fuerza atómica (AFM siglas en inglés). Instrumento que sirve para caracterizar los materiales a nivel superficial. Dentro de esas características está evaluar la dureza a escala manometría (nanodureza), utilizando el método de nanoindentación en el modo de espectroscopia. En materiales como las películas delgadas en los que sus espesores son del orden de decenas de nanómetros de espesor, el equipo adecuado para medir la dureza es el AFM. En este artículo se pretende realizar una primera aproximación a algunos modelos usados para evaluar la dureza usando el AFM a partir del modelo elástico.application/pdfspaUniversidad Católica de Pereirahttps://revistas.ucp.edu.co/index.php/entrecienciaeingenieria/article/view/558/568Derechos de autor 2019 Entre Ciencia e Ingenieríahttps://creativecommons.org/licenses/by-nc/4.0/deed.es_EShttps://creativecommons.org/licenses/by-nc/4.0/deed.es_ESinfo:eu-repo/semantics/openAccesshttp://purl.org/coar/access_right/c_abf2Entre ciencia e ingeniería; Vol 9 No 18 (2015); 75-83Entre Ciencia e Ingeniería; Vol. 9 Núm. 18 (2015); 75-83Entre ciencia e ingeniería; v. 9 n. 18 (2015); 75-832539-41691909-8367The Schottky diode as attenuator of the Seebeck effect on a Peltier cell for a PID temperature controlEl diodo Schottky como atenuador del efecto Seebeck en una celda Peltier para un control PID de temperaturaArtículo de revistahttp://purl.org/coar/resource_type/c_6501http://purl.org/coar/resource_type/c_2df8fbb1http://purl.org/coar/version/c_970fb48d4fbd8a85info:eu-repo/semantics/articleinfo:eu-repo/semantics/publishedVersionLeal, JesuéLeón, MónicaSepúlveda, SergioPublication10785/9787oai:repositorio.ucp.edu.co:10785/97872025-01-27 18:59:19.969https://creativecommons.org/licenses/by-nc/4.0/deed.es_ESDerechos de autor 2019 Entre Ciencia e Ingenieríametadata.onlyhttps://repositorio.ucp.edu.coRepositorio Institucional de la Universidad Católica de Pereira - RIBUCbdigital@metabiblioteca.com |
| dc.title.eng.fl_str_mv |
The Schottky diode as attenuator of the Seebeck effect on a Peltier cell for a PID temperature control |
| dc.title.spa.fl_str_mv |
El diodo Schottky como atenuador del efecto Seebeck en una celda Peltier para un control PID de temperatura |
| title |
The Schottky diode as attenuator of the Seebeck effect on a Peltier cell for a PID temperature control |
| spellingShingle |
The Schottky diode as attenuator of the Seebeck effect on a Peltier cell for a PID temperature control |
| title_short |
The Schottky diode as attenuator of the Seebeck effect on a Peltier cell for a PID temperature control |
| title_full |
The Schottky diode as attenuator of the Seebeck effect on a Peltier cell for a PID temperature control |
| title_fullStr |
The Schottky diode as attenuator of the Seebeck effect on a Peltier cell for a PID temperature control |
| title_full_unstemmed |
The Schottky diode as attenuator of the Seebeck effect on a Peltier cell for a PID temperature control |
| title_sort |
The Schottky diode as attenuator of the Seebeck effect on a Peltier cell for a PID temperature control |
| description |
In nanotechnology, one of the powerful tools is the atomic force microscope (AFM). Instrument used to characterize materials superficially. Nanoscale hardness (nanohardness) using nanoindentation method spectroscopy mode is considered when evaluating these characteristics. The suitable equipment to measure the hardness in materials such as thin films, with thicknesses on the order of tens of nanometers is the AFM. In this article, the authors propose a first approach to some models used to evaluate the hardness, using the AFM, based on the elastic model. |
| publishDate |
2019 |
| dc.date.issued.none.fl_str_mv |
2019-07-13 |
| dc.date.accessioned.none.fl_str_mv |
2022-06-01T19:08:32Z |
| dc.date.available.none.fl_str_mv |
2022-06-01T19:08:32Z |
| dc.type.spa.fl_str_mv |
Artículo de revista |
| dc.type.coar.fl_str_mv |
http://purl.org/coar/resource_type/c_2df8fbb1 |
| dc.type.coar.none.fl_str_mv |
http://purl.org/coar/resource_type/c_6501 |
| dc.type.coarversion.none.fl_str_mv |
http://purl.org/coar/version/c_970fb48d4fbd8a85 |
| dc.type.driver.none.fl_str_mv |
info:eu-repo/semantics/article |
| dc.type.version.none.fl_str_mv |
info:eu-repo/semantics/publishedVersion |
| format |
http://purl.org/coar/resource_type/c_6501 |
| status_str |
publishedVersion |
| dc.identifier.none.fl_str_mv |
https://revistas.ucp.edu.co/index.php/entrecienciaeingenieria/article/view/558 |
| dc.identifier.uri.none.fl_str_mv |
http://hdl.handle.net/10785/9787 |
| url |
https://revistas.ucp.edu.co/index.php/entrecienciaeingenieria/article/view/558 http://hdl.handle.net/10785/9787 |
| dc.language.none.fl_str_mv |
spa |
| language |
spa |
| dc.relation.none.fl_str_mv |
https://revistas.ucp.edu.co/index.php/entrecienciaeingenieria/article/view/558/568 |
| dc.rights.spa.fl_str_mv |
Derechos de autor 2019 Entre Ciencia e Ingeniería https://creativecommons.org/licenses/by-nc/4.0/deed.es_ES |
| dc.rights.uri.spa.fl_str_mv |
https://creativecommons.org/licenses/by-nc/4.0/deed.es_ES |
| dc.rights.accessrights.spa.fl_str_mv |
info:eu-repo/semantics/openAccess |
| dc.rights.coar.spa.fl_str_mv |
http://purl.org/coar/access_right/c_abf2 |
| rights_invalid_str_mv |
Derechos de autor 2019 Entre Ciencia e Ingeniería https://creativecommons.org/licenses/by-nc/4.0/deed.es_ES http://purl.org/coar/access_right/c_abf2 |
| eu_rights_str_mv |
openAccess |
| dc.format.none.fl_str_mv |
application/pdf |
| dc.publisher.spa.fl_str_mv |
Universidad Católica de Pereira |
| dc.source.eng.fl_str_mv |
Entre ciencia e ingeniería; Vol 9 No 18 (2015); 75-83 |
| dc.source.spa.fl_str_mv |
Entre Ciencia e Ingeniería; Vol. 9 Núm. 18 (2015); 75-83 |
| dc.source.por.fl_str_mv |
Entre ciencia e ingeniería; v. 9 n. 18 (2015); 75-83 |
| dc.source.none.fl_str_mv |
2539-4169 1909-8367 |
| institution |
Universidad Católica de Pereira |
| repository.name.fl_str_mv |
Repositorio Institucional de la Universidad Católica de Pereira - RIBUC |
| repository.mail.fl_str_mv |
bdigital@metabiblioteca.com |
| _version_ |
1831929551717924864 |