The Schottky diode as attenuator of the Seebeck effect on a Peltier cell for a PID temperature control
In nanotechnology, one of the powerful tools is the atomic force microscope (AFM). Instrument used to characterize materials superficially. Nanoscale hardness (nanohardness) using nanoindentation method spectroscopy mode is considered when evaluating these characteristics. The suitable equipment to...
- Autores:
- Tipo de recurso:
- Article of journal
- Fecha de publicación:
- 2019
- Institución:
- Universidad Católica de Pereira
- Repositorio:
- Repositorio Institucional - RIBUC
- Idioma:
- spa
- OAI Identifier:
- oai:repositorio.ucp.edu.co:10785/9787
- Acceso en línea:
- https://revistas.ucp.edu.co/index.php/entrecienciaeingenieria/article/view/558
http://hdl.handle.net/10785/9787
- Palabra clave:
- Rights
- openAccess
- License
- Derechos de autor 2019 Entre Ciencia e Ingeniería
| Summary: | In nanotechnology, one of the powerful tools is the atomic force microscope (AFM). Instrument used to characterize materials superficially. Nanoscale hardness (nanohardness) using nanoindentation method spectroscopy mode is considered when evaluating these characteristics. The suitable equipment to measure the hardness in materials such as thin films, with thicknesses on the order of tens of nanometers is the AFM. In this article, the authors propose a first approach to some models used to evaluate the hardness, using the AFM, based on the elastic model. |
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