APA (7th ed.) Citation

(2019). An optical diffuse reflectance model for the characterization of a si wafer with an evaporated SiO2 layer.

Chicago Style (17th ed.) Citation

An Optical Diffuse Reflectance Model for the Characterization of a Si Wafer with an Evaporated SiO2 Layer. 2019.

MLA (8th ed.) Citation

An Optical Diffuse Reflectance Model for the Characterization of a Si Wafer with an Evaporated SiO2 Layer. 2019.

Warning: These citations may not always be 100% accurate.