Methodology to Prepare Patent Analysis and the Technological Maturity Cycle

The analysis of patents and the behavior of technology over time have aroused great interest at institutions and companies because they serve as a guide to make decisions on research and innovation projects. Based on this, a methodology that seeks to guide the reader in the preparation of this type...

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Autores:
Tipo de recurso:
Fecha de publicación:
2023
Institución:
Universidad Pedagógica y Tecnológica de Colombia
Repositorio:
RiUPTC: Repositorio Institucional UPTC
Idioma:
eng
OAI Identifier:
oai:repositorio.uptc.edu.co:001/14340
Acceso en línea:
https://revistas.uptc.edu.co/index.php/ingenieria/article/view/14299
https://repositorio.uptc.edu.co/handle/001/14340
Palabra clave:
Forecasting
orbit
patent analysis
technology life cycle
predicciones
orbit
analisis de patentes
ciclo de vida tecnologico
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License
http://creativecommons.org/licenses/by/4.0
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dc.title.en-US.fl_str_mv Methodology to Prepare Patent Analysis and the Technological Maturity Cycle
dc.title.es-ES.fl_str_mv Metodología para la elaboración de análisis de patentes y ciclo de madurez tecnológica
title Methodology to Prepare Patent Analysis and the Technological Maturity Cycle
spellingShingle Methodology to Prepare Patent Analysis and the Technological Maturity Cycle
Forecasting
orbit
patent analysis
technology life cycle
predicciones
orbit
analisis de patentes
ciclo de vida tecnologico
title_short Methodology to Prepare Patent Analysis and the Technological Maturity Cycle
title_full Methodology to Prepare Patent Analysis and the Technological Maturity Cycle
title_fullStr Methodology to Prepare Patent Analysis and the Technological Maturity Cycle
title_full_unstemmed Methodology to Prepare Patent Analysis and the Technological Maturity Cycle
title_sort Methodology to Prepare Patent Analysis and the Technological Maturity Cycle
dc.subject.en-US.fl_str_mv Forecasting
orbit
patent analysis
technology life cycle
topic Forecasting
orbit
patent analysis
technology life cycle
predicciones
orbit
analisis de patentes
ciclo de vida tecnologico
dc.subject.es-ES.fl_str_mv predicciones
orbit
analisis de patentes
ciclo de vida tecnologico
description The analysis of patents and the behavior of technology over time have aroused great interest at institutions and companies because they serve as a guide to make decisions on research and innovation projects. Based on this, a methodology that seeks to guide the reader in the preparation of this type of study; both the body of the document and its interpretation has been developed. Two software were used to describe the extraction of patent data; Orbit Intelligence (Licensed Software) and Lens (Open access version). The information obtained, using the same search equation, was presented. For the analysis of the technological maturity cycle, the logistic model was obtained, and it was executed in the Loglet Lab 4 software to obtain the growth curve S. Finally, the Yoon parameters were presented to give a predictive concept of the behavior of the technology over time. The case study that was taken as an example was the technology of “Antibacterial and self-cleaning surfaces based on TiO2/ZnO”, which applied this methodology,  we found that the technology of interest is in the maturity phase. It has a high impact on the market, being an important indicator for decision-making focused on research and development. According to what has been proposed, the exposed methodology is a tool to have in consideration that allows to present a more accurate concept about the future projections of a technology, based on the analysis of patent data. Moreover, it is important to consider the trends of the market and the socio-political situation.
publishDate 2023
dc.date.accessioned.none.fl_str_mv 2024-07-05T19:12:07Z
dc.date.available.none.fl_str_mv 2024-07-05T19:12:07Z
dc.date.none.fl_str_mv 2023-02-09
dc.type.none.fl_str_mv info:eu-repo/semantics/article
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status_str publishedVersion
dc.identifier.none.fl_str_mv https://revistas.uptc.edu.co/index.php/ingenieria/article/view/14299
10.19053/01211129.v32.n63.2023.14299
dc.identifier.uri.none.fl_str_mv https://repositorio.uptc.edu.co/handle/001/14340
url https://revistas.uptc.edu.co/index.php/ingenieria/article/view/14299
https://repositorio.uptc.edu.co/handle/001/14340
identifier_str_mv 10.19053/01211129.v32.n63.2023.14299
dc.language.none.fl_str_mv eng
dc.language.iso.spa.fl_str_mv eng
language eng
dc.relation.none.fl_str_mv https://revistas.uptc.edu.co/index.php/ingenieria/article/view/14299/12878
https://revistas.uptc.edu.co/index.php/ingenieria/article/view/14299/13181
dc.rights.en-US.fl_str_mv http://creativecommons.org/licenses/by/4.0
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text/xml
dc.publisher.en-US.fl_str_mv Universidad Pedagógica y Tecnológica de Colombia
dc.source.en-US.fl_str_mv Revista Facultad de Ingeniería; Vol. 32 No. 63 (2023): January-March 2023 (Continuous Publication); e14299
dc.source.es-ES.fl_str_mv Revista Facultad de Ingeniería; Vol. 32 Núm. 63 (2023): Enero-Marzo 2023 (Publicación Continua); e14299
dc.source.none.fl_str_mv 2357-5328
0121-1129
institution Universidad Pedagógica y Tecnológica de Colombia
repository.name.fl_str_mv Repositorio Institucional UPTC
repository.mail.fl_str_mv repositorio.uptc@uptc.edu.co
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spelling 2023-02-092024-07-05T19:12:07Z2024-07-05T19:12:07Zhttps://revistas.uptc.edu.co/index.php/ingenieria/article/view/1429910.19053/01211129.v32.n63.2023.14299https://repositorio.uptc.edu.co/handle/001/14340The analysis of patents and the behavior of technology over time have aroused great interest at institutions and companies because they serve as a guide to make decisions on research and innovation projects. Based on this, a methodology that seeks to guide the reader in the preparation of this type of study; both the body of the document and its interpretation has been developed. Two software were used to describe the extraction of patent data; Orbit Intelligence (Licensed Software) and Lens (Open access version). The information obtained, using the same search equation, was presented. For the analysis of the technological maturity cycle, the logistic model was obtained, and it was executed in the Loglet Lab 4 software to obtain the growth curve S. Finally, the Yoon parameters were presented to give a predictive concept of the behavior of the technology over time. The case study that was taken as an example was the technology of “Antibacterial and self-cleaning surfaces based on TiO2/ZnO”, which applied this methodology,  we found that the technology of interest is in the maturity phase. It has a high impact on the market, being an important indicator for decision-making focused on research and development. According to what has been proposed, the exposed methodology is a tool to have in consideration that allows to present a more accurate concept about the future projections of a technology, based on the analysis of patent data. Moreover, it is important to consider the trends of the market and the socio-political situation.El análisis de patentes y el comportamiento de la tecnología en el tiempo han despertado un gran interés en las instituciones y compañías debido a que sirve como una guía en la toma de decisiones sobre proyectos de investigación e innovación. Basados en lo anterior, una metodología que busca guiar al lector en la elaboración de este tipo de estudios, tanto el cuerpo del documento como su interpretación. Se utilizaron dos softwares para describir la extracción de datos de patentes Orbit Intelligence (Software licenciado) y Lens (Versión de acceso libre) y se presentó la información obtenida a partir del uso de la ecuación de búsqueda. Para el análisis del ciclo de madurez tecnológica se utilizó el modelo logístico y se ejecutó en el algoritmo Loglet Lab 4 para obtener la curva de crecimiento S. Finalmente, se proponen los parámetros de Yoon para dar un concepto predictivo del comportamiento de la tecnología en el tiempo. El caso de estudio que se tomó como ejemplo fue la tecnología de “Superficies antibacteriales y autolimpiantes a base TiO2/ZnO”. Al aplicar esta metodología, se encontró que la fase de madurez en la que se encuentra la tecnología de interés sugiere un alto impacto en el mercado. Este indicador importante para la toma de decisiones enfocadas a la investigación y desarrollo. De acuerdo con lo planteado, la metodología expuesta es una herramienta que permite presentar un concepto más acertado sobre las proyecciones futuras de una tecnología, basadas en el análisis de datos de patentes. No obstante, es importante tener en cuenta las tendencias del mercado y la situación sociopolítica.application/pdftext/xmlengengUniversidad Pedagógica y Tecnológica de Colombiahttps://revistas.uptc.edu.co/index.php/ingenieria/article/view/14299/12878https://revistas.uptc.edu.co/index.php/ingenieria/article/view/14299/13181Copyright (c) 2023 Santiago Sinisterrra, Ruben Camargo-Amado, Diego Triviño, Fiderman Machuca-Martínezhttp://creativecommons.org/licenses/by/4.0http://purl.org/coar/access_right/c_abf271http://purl.org/coar/access_right/c_abf2Revista Facultad de Ingeniería; Vol. 32 No. 63 (2023): January-March 2023 (Continuous Publication); e14299Revista Facultad de Ingeniería; Vol. 32 Núm. 63 (2023): Enero-Marzo 2023 (Publicación Continua); e142992357-53280121-1129Forecastingorbitpatent analysistechnology life cycleprediccionesorbitanalisis de patentesciclo de vida tecnologicoMethodology to Prepare Patent Analysis and the Technological Maturity CycleMetodología para la elaboración de análisis de patentes y ciclo de madurez tecnológicainfo:eu-repo/semantics/articlehttp://purl.org/coar/resource_type/c_2df8fbb1info:eu-repo/semantics/publishedVersionhttp://purl.org/coar/version/c_970fb48d4fbd8a354http://purl.org/coar/version/c_970fb48d4fbd8a85Sinisterra, SantiagoCamargo-Amado, Rubén Triviño, DiegoMachuca-Martínez, Fiderman001/14340oai:repositorio.uptc.edu.co:001/143402025-07-18 11:53:44.261metadata.onlyhttps://repositorio.uptc.edu.coRepositorio Institucional UPTCrepositorio.uptc@uptc.edu.co